Atomic Imaging of 2D and 3D Materials with Scanning Transmission Electron Microscopy
Naval Research Lab (2014) - Invited
When Art Exceeds Perception
CCA Biennial Symposium: Intimate Cosmologies (2014) - Invited
Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM
Microscopy and Microanalysis (2014)
Artifact Reduction in Fourier Analysis of Atomic Resolution Images
The Cornell Spectrum Imager
Intl. Workshop on Electron Microscopy Software, hosted by NION (2014) - Invited
Open-Source Visualization of 3D Data: From Tomography to Spectroscopy
Kitware Inc. (2014) - Invited
Breaking the Crowther Limit with “Sudoku” Tomography: Combining Depth-Sectioning and Tilt Series for High-Resolution, Wide-Field Reconstructions;
Microscopy and Microanalysis (2013)
Open-Source Visualization of 3D Data: From Tomography to Spectroscopy
Microscopy and Microanalysis (2013)
Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography
FCMN at NIST, Mar. 2013 - Invited
High-Resolution, Through-Focal Tomography of Ensembles of Porous PtCu Nanoparticles
Materials Research Society, Nov. 2013
Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene,
Microscopy and Microanalysis, Aug. 2012
Efficient Elastic Imaging of Single Atoms with Aberration‐Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis 2011 Meeting
Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography
Tech Con, Sept. 2011
Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography
Semiconductor Research Corporation GRC Patterning Review, Nov. 2010
Atomic-Scale Chemical Reactions at Buried Interfaces in Copper/Low-K Interconnects
Semiconductor Research Corporation GRC Back End Processes and Packaging Review, Oct. 2010
Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning
Microscopy and Microanalysis 2010 Meeting, Aug. 2010
Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography, Semiconductor Research Corporation
GRC Patterning Review, Nov. 2009
Conference Abstracts (partial list)
tomviz: Open-Source Visualization and Analysis Platform for 3D Reconstructions of Materials
Microscopy and Microanalysis (2014)
STEM Characterization of Nano-Crystallites in the Nacre Biomineralization of Mollusk Shells (Pinna Nobilis)
Microscopy and Microanalysis (2014)
Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions
Microscopy and Microanalysis (2014)
Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM
Microscopy and Microanalysis (2014)
Three-Dimensional Arrangement and Connectivity of Lead-Chalcogenide Nanoparticle Assemblies for Next Generation Photovoltaics
Microscopy and Microanalysis (2014)
Filling the Missing Wedge in Tomography: A Constraint-Based Reconstruction Method for 3D TEM STEM Imaging;
Microscopy and Microanalysis (2013)
Advanced Spectrum Analysis with Open Source Software
Microscopy and Microanalysis (2013)
Breaking the Crowther Limit with “Sudoku” Tomography: Combining Depth-Sectioning and Tilt Series for High-Resolution, Wide-Field Reconstructions;
Microscopy and Microanalysis (2013)
Open-Source Visualization of 3D Data: From Tomography to Spectroscopy
Microscopy and Microanalysis (2013)
Quantized Strain Channels in Bilayer Graphene
American Physical Society 58 (2013)
Three-Dimensional and Spectroscopic Characterization of Devices at the Atomic Scale Using Aberration-Corrected Electron Tomography
FCMN (2013)
Tilted Dark Field TEM of Twinning and Twisting in Tri- and Bi-layer Graphene
Microscopy and Microanalysis (2012)
Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass
Microscopy and Microanalysis (2012)
Structure-Property Relationships for Graphene Grains and Grain Boundaries
Microscopy and Microanalysis (2012)
Failure of . the Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling
Microscopy and Microanalysis (2012)
Imaging the Atoms in a Two-Dimensional Silica Glass on Graphene New Approaches to Data
Microscopy and Microanalysis (2012)
Processing for Atomic Resolution EELS
Microscopy and Microanalysis (2012)
3-D Tracking and Visualization of Hundreds of Fuel Cell Nanocatalysts during Electrochemical Aging
PRiME (2012)
TEM Imaging of Stacking Order and Twist Angle in Bilayer CVD Graphene, MRS Spring (2012)
Efficient Elastic Imaging of Single Atoms with Aberration‐Corrected Scanning Transmission Electron Microscopy, Microscopy and Microanalysis (2011)
Cornell Spectrum Imager: Open Source Spectrum Analysis with ImageJ, Microscopy and Microanalysis (2011)
3‐D Tracking and Visualization of Hundreds of Fuel Cell Nanocatalysts During Electrochemical Aging, Microscopy and Microanalysis (2011)
Atomic-Resolution Electron Energy Loss Spectroscopy of Fuel Cell Nanocatalysts, Gotham-Metro Condensed Matter Meeting, Nov 2011
Determining Resolution in an Aberration-Corrected Era: Why Your Probe Is Larger Than You Thought Microscopy and Microanalysis (2010), 16: 152-153, doi: 10.1017/S1431927610060319
Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning, Microscopy and Microanalysis (2010), 16: 1838-1839, doi: 10.1017/S1431927610060848
Three-dimensionally Networked Nanocomposites, MRS Spring 2010
Electron Channeling Artifacts in Sub-Angstrom STEM Images, Cornell Engineering Research Conference, Feb. 2010
Excitation of Transverse Eigenstates in Si [211] with Swift Electrons, Gotham-Metro Condensed Matter Meeting, Nov 2009
Electron Channeling Artifacts in Silicon 211 Using Aberration-Corrected STEM, Microscopy and Microanalysis, Volume 15, Supplement S2, Jul 2009, pp 1492-1493, doi: 10.1017/S1431927609094896